 | | | | | | Item Specifics - Item Condition | | | Condition: | Used | | | |
| | Manufacturing Category : | Semiconductor & PCB Equipment | | | | | | |
|
| |
| |
| | |
|
|
Hitachi SEM Scanning Electron Microscope, model S-806C. Removed from working service at a local semiconductor processing company. The first picture is a catalog shot, the left PC and Printer are not included. Other than that, the system is complete, with two external vacuum pumps, power conditioner and pictured equipment, along with cables. All cosmetic panels are included, some removed for the photo's. I can come to your site and connect all the cables and connect to 240/120 volt supply. All that would be needed is for a recalibration of the system. I also have a manual for the system too. Some of the specs I found on the web are below. Email for a shipping quote and other info, feel free to call me at 714-402-5665, Steve. Guarantied working, just not calibrated.
Wafer Inspection Field Emission SEM.
Permits inspection of in-process wafers of up to 6 in. in diameter without coating or beam damage.
The inspected wafers may then be returned to the process line.
The cold field emission electron source assures quality images at all operating voltages.
The sample stage is fully computer controlled for ease of operation and high sample throughput.
Resolution: 15 nm at 1 kV.
Magnification: 50X - 100,000X.
Accelerating Voltage: 0.5 - 15 kV.
Sample Size: 6 in. wafer (max.).
Sample Stage: X/Y: 150 mm.
|
00959 |
| |
Track up to 10 items on this computer in 
)
)
